TY  - CONF

T1  - Surveying the Developer Experience of Flaky Tests

JO  - 2022 IEEE/ACM 44th International Conference on Software Engineering: Software Engineering in Practice (ICSE-SEIP)

UR  - http://dx.doi.org/10.1109/icse-seip55303.2022.9793965

PY  - 2022/01/01

AU  - Parry O

AU  - Kapfhammer GM

AU  - Hilton M

AU  - McMinn P

ED  - 

DO  - DOI: 10.1109/icse-seip55303.2022.9793965

PB  - IEEE

Y2  - 2024/12/28

ER  -